| X荧光筛选法在树脂等材料卤素含量分析中的应用 |
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| 引用本文： | 赵刚,邓波. X荧光筛选法在树脂等材料卤素含量分析中的应用[J]. 电子质量, 2013, 0(1): 36-39 |
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| 作者姓名： | 赵刚 邓波 |
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| 作者单位： | 四川长虹电器股份有限公司,四川绵阳,621000 |
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| 摘 要： | 采用X荧光筛选法可快速分析电子产品中卤素元素氯、溴元素的含量。选用岛津EDX-LE能量色散型X荧光光谱仪,EDX-LE具有较好的灵敏度和精确度,在大气氛围下进行氯和溴含量的测试,该方法可用于树脂材料等电子产品中的卤素筛选分析。
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| 关 键 词： | X荧光 卤素 树脂材料 |
Halogens Contents Analysis Application by X Fluorescence Screening Method for Resinous Materials |
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| Zhao Gang , Deng Bo. Halogens Contents Analysis Application by X Fluorescence Screening Method for Resinous Materials[J]. Electronics Quality, 2013, 0(1): 36-39 |
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| Authors: | Zhao Gang Deng Bo |
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| Affiliation: | (Sichuan Changhong Electric Co.,Ltd.,Sichuan Mianyang 621000) |
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| Abstract: | The X-ray fluorescence screening method can rapid analysis halogen element chlorine,bromine element content in electronic products.We choose EDX-LE type X-ray fluorescence spectrometer of SHI-MADZU,because EDX-LE sensitivity and accuracy are very good,in air atmosphere of chlorine and bromine content test,this method can be used for halogen screening analysis in resin materials and others electronic products. |
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| Keywords: | X-ray fluorescence halogen element resin materials |
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