1.Ioffe Institute, 194021, St. Petersburg, Russia ;2.Saint Petersburg State Forest Technical Academy, 194021, St. Petersburg, Russia ;3.National Research University of Electronic Technology, 124498, Zelenograd, Moscow oblast, Russia ;
Abstract:
Semiconductors - The current–voltage characteristics measured on Ge2Sb2Te5 thin films in the current mode are studied. The effect of multilevel recording is established when applying...