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Magnetic microstructure of sputtered Co-Cr films |
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| Authors: | P. ten Berge, J.C. Lodder, R. Pl ß l,J.N. Chapman |
| Affiliation: | a MESA Research Institute, University of Twente, P.O. Box 217, 7500 AE, Enschede, The Netherlands b Department of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK |
| Abstract: | The magnetic microstructure of a thickness series of Co81Cr19 layers on Si3N4 membranes is investigated by modified differential phase contrast (MDPC) microscopy. The development from cross-rie wall structures for a thickness < 25 nm to more complicated structures for a thickness > 50 nm is related to the macroscopic VSM measurements and the crystallite orientation determined from electron diffraction experiments. |
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