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Magnetic microstructure of sputtered Co-Cr films
Authors:P ten Berge  JC Lodder  R Plßl  JN Chapman
Institution:

a MESA Research Institute, University of Twente, P.O. Box 217, 7500 AE, Enschede, The Netherlands

b Department of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK

Abstract:The magnetic microstructure of a thickness series of Co81Cr19 layers on Si3N4 membranes is investigated by modified differential phase contrast (MDPC) microscopy. The development from cross-rie wall structures for a thickness < 25 nm to more complicated structures for a thickness > 50 nm is related to the macroscopic VSM measurements and the crystallite orientation determined from electron diffraction experiments.
Keywords:
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