XPS evidence for band bending at semiconducting oxide surfaces |
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| Authors: | R.St.C. Smart |
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| Affiliation: | School of Science, Griffith University, Nathan, Queensland 4111, Australia |
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| Abstract: | The magnitude of the surface potential, directly influenced by defect properties and donor or acceptor chemisorption, has been studied using XPS for p-type nickel oxide surfaces. Above 200 W, the KE shifts are independent of X-ray intensity. A simple explanation of the dependence of the surface potential (Vch) on band bending (Vs) is proposed with preliminary experimental evidence allowing derivation of values of Vs. |
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