Ion induced secondary electron emission from single crystal surfaces

Yields of ion impact induced electrons from very pure Ni(110) and Ni(111) surfaces have been measured. In several tilt planes the angle of incidence of a 5 keV H⁺, H⁺₂ or H⁺₃ ion beam is varied from perpendicular to grazing incidence. Below = 75° the yield increases as sec but shows characteristic depressions when the beam is incident along crystallographically low indexed lattice directions. This is explained by kinetic electron emission with respect to the projectile transparency of the crystal lattice.