Study on titanium carbide field emitters by field-ion microscopy,field-electron emission microscopy,Auger electron spectroscopy,and atom-probe field-ion microscopy |
| |
| Authors: | M Futamoto I Yuito U Kawabe O Nishikawa Y Tsunashima Y Hara |
| |
| Institution: | Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185, Japan;Department of Materials Science and Engineering, The Graduate School at Nagatsuta, Tokyo Institute of Technology, Midori-ku, Yokohama 227, Japan |
| |
| Abstract: | Surface structure, composition, and some field-electron emission properties are examined for thermally annealed titanium carbide emitters. As a result of high temperature heating, low-index planes of {100} and {111} become facetted and are observed as dark areas in field-electron emission patterns. Electrons are emitted predominantly from the {110} planes. The surface composition becomes enriched with carbon when the carbon deficient titanium carbide, TiC0.71, is heated at high temperatures in vacuum better than 10?7 Pa. The topmost (110) layer consists of both Ti and C atoms. The instability in the electron emission current of titanium carbide is considered to be due to the local work function change caused by an interaction between vacuum residual gases and chemically active titanium atoms on the emitter surface. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
