Thin-film photoelectromagnetic detectors for infrared radiation |
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| Affiliation: | 1. Mahindra Ecole Centrale, Survey No: 62/1A, Bahadurpally Jeedimetla, Hyderabad 500043, Telangana, India;2. Central University of Kerala, Riverside Transit Campus, Padnekkad P.O., Kasaragod 671314, Kerala, India;3. Indian Institute of Technology Bombay, Powai, Mumbai 400076, Maharashtra, India;1. School of Geography, Earth and Environmental Sciences, University of Birmingham, United Kingdom;2. GEOMAR Helmholtz Centre for Ocean Research Kiel, Germany;3. Marine Geology & Seafloor Surveying, Department of Geosciences, University of Malta, Malta;4. Department of Earth and Planetary Sciences, Birkbeck, University of London, United Kingdom;5. Institute for Risk and Disaster Reduction, University College London, United Kingdom;6. Institut für Geologie, Leopold-Franzens-Universität Innsbruck, Austria;1. Pharmacy Discipline, School of Clinical Sciences, Queensland University of Technology, Brisbane, QLD, Australia;2. Institute of Health Biomedical Innovation (IHBI), Queensland University of Technology, Brisbane, QLD, Australia;3. School of Chemistry, Physics and Mechanical Engineering, Science and Engineering Faculty, Queensland University of Technology, Brisbane, QLD, Australia;4. Translational Research Institute, Brisbane, QLD, Australia;5. Department of Polymer Science and Engineering, Zhejiang University, Hangzhou, China;1. Inserm, LIRIC - UMR 995, F-59 000 Lille, France;2. University of Lille, LIRIC - UMR 995, F-59 000 Lille, France;3. CHRU of Lille, LIRIC - UMR 995, F-59 000 Lille, France;4. Institute of Virology, University Medical Center Freiburg, Freiburg, Germany;5. Mucosal Immunobiology and Vaccine Center (MIVAC), Department of Microbiology and Immunology, Institute of Biomedicine, Sahlgrenska Academy, University of Gothenburg, Gothenburg, Sweden;6. University of Artois, 62300 Lens, France |
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| Abstract: | Using the theory of the PEM effect for thin-film samples, in which the interference of radiation internally reflected from the sample surfaces is possible, the performance of PEM far-infrared detectors is discussed. The results of numerical computation done for CdHgTe at 300K are presented. The voltage responsivity, spectral responsivity, total responsivity, detectivity and time constant are reported as functions of sample thickness, magnetic field, and the semiconductor parameters: carrier lifetime, recombination velocities at illuminated and unilluminated sample surfaces, absorption coefficient and doping level. The thickness of thin-film PEM detectors is one of the more important parameters which can affect their performance. |
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