|
|||||
|
|
Statistical Analysis of Full-Chip Leakage Power for 65nm CMOS Node and Beyond |
|
| Authors: | LI Tao YU Zhiping |
| Institution: | Institute of Microelectronics, Tsinghua University, Beijing 100085, China |
| Abstract: | |
| Keywords: | Statistical analysis Junction tunneling leakage Gaussian and non-Gaussian parameter distributions |
| 本文献已被 维普 等数据库收录！ | |