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Scanning thermal microscopy techniques for polymeric thin films using temperature contrast mode to measure thermal diffusivity and a novel approach in conductivity contrast mode to the mapping of thermally conductive particles
Affiliation:1. School of Mathematical Sciences, Huaqiao University, Quanzhou 362021, China;2. School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, China;3. Department of Mathematics and Institute for Quantum Science and Engineering, Texas A&M University, College Station, TX 77843, USA;4. Science Program, Texas A&M University at Qatar, Education City, Doha, Qatar
Abstract:Advances in production are leading to increasing use of polymeric thin films in applications such as automotive bearings. Two approaches have been developed to study the thermophysical properties of these thin films: The first technique based on Flash theory uses a scanning thermal microscopy (SThM) tip in temperature contrast mode to measure thermal diffusivity over a nano-scale area. The SThM tip is in contact with the upper surface of the film to detect a heat pulse delivered by a microelectromechanical heater platform from the lower surface. The second technique is a conductivity contrast mode SThM based approach for measuring the size and distribution of thermally conducting particles in thin film polymeric coatings. Topographical and thermal conductivity data are combined to produce a “correlation analysis value” 3D particle map of the coating. Good practice and a case study are highlighted.
Keywords:Automotive  Polymer  Scanning thermal microscopy  Thermal conductivity  Thermal diffusivity  Thin film
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