Nanoparticle size characterization by laser light scattering

Spherical semiconductor nanoparticles (ZnS) were specially fabricated by an inexpensive chemical route. The scattering profile of the nanoparticles was investigated by laser light scattering technique. A beam of polarized light from a diode laser (λ ₀ ≈ 630 nm) was allowed to fall on the nanospheres embedded in flexible host matrix Polyvinyl Alcohol (PVA). The light scattered from the samples were detected by means of analyzer mounted photodiode array from 10° to 170° in steps of 1°. Signals from the detectors were interfaced with a high resolution data acquisition system and the whole experiment was carried out in differential mode. Size of the nanoparticles was obtained by using Mie theory and verified by T-matrix approach. The results obtained agree with the XRD and TEM results.