| Polarization Fatigue in Ferroelectric Thin Films |
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| 作者姓名： | 王忆 K.H.WONG |
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| 作者单位： | [1]StructureResearchLaboratory＆DepartmentofAstronomyandAppliedPhysics,UniversityofScienceandTechnologyofChina,Hefei230026 [2]DepartmentofAppliedPhysics,TheHongKongPolytechnicUniversi |
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| 摘 要： | The fatigue problem in ferroelectric thin films is investigated based on the switched charge per unit area versus switching cycles.The temperature,dielectric permittivity,voltage bias,frequency and defect valence dependent switching polarization properties are calculated quantitatively with an extended Dawber-Scott model.The results are in agreement with the recent experiments.
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| 关 键 词： | 薄膜 铁电薄膜 极化疲劳 |
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