An analytical model for thermal diffusivity measurements of film substrate composite using the mirage technique

The thermal diffusivity h of a thin film on a substrate is measured by using the mirage technique. The photothermal deflection of the probe beam is caused by the heat field and the substrate, heated by the pump beam. From the experimental data a two-dimensional algorithm is proposed to obtain the measurements of the diffusivity of film and substrate in one set of mirage detection.