Specular neutron reflectivity and beyond

A polarized neutron reflectometer for vertical samples is available at Dhruva reactor guide hall, Trombay. The reflectometer has been designed for horizontal scattering vector. It uses a position-sensitive detector for obtaining the reflectivity pattern. This arrangement allows one to obtain diffuse or off-specular intensity around any specular peak at one go. We have used this instrument for studying the structure of various metal-metal and metal-semiconductor multilayers by specular reflectometry. We have also been successful in understanding interface morphology of several films through diffuse neutron reflectometry (DNR) on this reflectometer. Some of the recent results are presented in this paper to demonstrate the strength of these two techniques.