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Ellipsometric characterization of PbI2 thin film on glass |
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| Authors: | A Ahmad S Saq’an M Hassan H El-Nasser |
| Institution: | a Department of Physical Sciences, Jordan University of Science and Technology, Irbid 22110, Jordan b Department of Physics, Jordan University, Amman Jordan c Princess Sumaya University for Technology, Amman Jordan d Department of Physics, Al al-Bayt University, Mafraq Jordan |
| Abstract: | The optical properties of polycrystalline lead iodide thin film grown on Corning glass substrate have been investigated by spectroscopic ellipsometry. A structural model is proposed to account for the optical constants of the film and its thickness. The optical properties of the PbI2 layer were modeled using a modified Cauchy dispersion formula. The optical band gap Eg has been calculated based on the absorption coefficient (α) data above the band edge and from the incident photon energy at the maximum index of refraction. The band gap was also measured directly from the plot of the first derivative of the experimental transmission data with respect to the light wavelength around the transition band edge. The band gap was found to be in the range of 2.385±0.010 eV which agrees with the reported experimental values. Urbach's energy tail was observed in the absorption trend below the band edge and was found to be related to Urbach's energy of 0.08 eV. |
| Keywords: | 78 20 Ci 78 66 &minus w 78 40 Fy 78 20 Bh 78 68 +m 71 20 Nr |
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