| Abstract: | We present a theory based on an exact calculation of the radiation forces on a microsized particle illuminated by evanescent waves created under total internal reflection in a flat substrate. The influence of the proximity of this interface to the particle is analyzed by a numerical simulation that addresses multiple scattering of light between the particle and the dielectric flat surface. We thus give an interpretation of the experimental results of Kawata and Sugiura Opt. Lett. 17, 772 (1992)] and put forward a method that is capable of predicting new effects. |
