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A study of radiation effects of 9 and 12 MeV protons on Chinese CMOS image sensor degradation |
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| Authors: | MENG Xiang-Ti HUANG Qiang MA Yan-Xiu ZHENG Yong-Nan FAN Ping ZHU Sheng-Yun Institute of Nuclear and New Energy Technology Tsinghua University Beijing China China Institute of Atomic Energy Beijing China |
| Institution: | [1]Institute of Nuclear and New Energy Technology, Tsinghua University, Beijing 100084, China [2]China Institute of Atomic Energy, Beijing 102413, China |
| Abstract: | |
| Keywords: | semiconductor technology CMOS image sensor proton irradiation average brightness TRIM simulation |
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