Correlation between the substrate roughness and light loss for interference mirror coatings |
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| Authors: | Email author" target="_blank">M?L?ZanaveskinEmail author B?S?Roshchin Yu?V?Grishchenko V?V?Azarova V?E?Asadchikov A?L?Tolstikhina |
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| Institution: | (1) Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskiĭ pr. 59, Moscow, 119333, Russia;(2) FGUP NII Polyus, Moscow, Russia |
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| Abstract: | The correlation between the parameters of multilayer mirror coatings used in ring laser gyroscopes with the roughness height of the substrate and top surface of mirror coating is investigated. A complex approach is applied to analysis of the roughness of substrates and mirror coatings, which is based on the use of atomic force microscopy and X-ray scattering. A correlation between the roughness of substrates and mirror coatings is established. In addition, the correlation between the scattering coefficient, reflectance, and transmittance of multilayer mirror coatings and the roughness of the substrates used is investigated. |
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