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铁电薄膜的厚度对其相变性质的影响
引用本文:游娜,张现军,王胜平.铁电薄膜的厚度对其相变性质的影响[J].电子科技,2010,23(9):71-73.
作者姓名:游娜  张现军  王胜平
作者单位:(1.西安电子科技大学 理学院,陕西 西安 710071;2.西安电子科技大学 微电子学院,陕西 西安 710071;3.总参通信部驻济南地区 军事代表室,山东 济南 250014)
摘    要:当铁电薄膜的厚度改变时,利用平均场近似方法,研究了基于横场伊辛模型的铁电薄膜的相变性质。在文中利用数值计算方法计算了不同厚度的铁电薄膜的相图和居里温度。研究结果表明,厚度对铁电薄膜的相图会产生明显的影响,但对居里温度则几乎没有影响。

关 键 词:铁电薄膜  横场伊辛模型  相图  居里温度  

Influence of the Thickness of the Ferroelectric Thin Film on its Phase Transition Properties
You Na,Zhang Xianjun,Wang Shengping.Influence of the Thickness of the Ferroelectric Thin Film on its Phase Transition Properties[J].Electronic Science and Technology,2010,23(9):71-73.
Authors:You Na  Zhang Xianjun  Wang Shengping
Institution:(1.School of Science,Xidian University,Xi'an 710071,China;2.School of Microelectrics,Xidian University,Xi'an 710071,China;3.General Staff Department,Jinan Agency of the Communication Ministry,Jinan 250014,China)
Abstract:In the change of the thickness of the ferroelectric thin film,a study is made of the properties of phase transition of the ferroelectric thin film based on the transverse field Ising model using the framework of the mean field approximation.A calculation of the phase diagrams and polarizations as well as the Curie temperature of the ferroelectric thin film with different thickness is made by numerical method.Results show that the thickness has sensitive effect on the phase diagrams and the polarizations.How...
Keywords:ferroelectric thin film  transverse Ising model  phase diagrams  Curie temperature  
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