Self-calibration of Silicon Photodiode in the Soft X Ray Spectral Range |
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| Authors: | ZHANG DongQing CUI MingQi ZHU PeiPing ZHAO YiDong CUI CongWu |
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| Institution: | Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 100039,China |
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| Abstract: | Self-calibration experiment of silicon photodiodes in the soft X-ray spectral region of synchrotron radiation (50—2000eV) is carried out. Because of elimination of “dead region” and adoption of very thin SiO2 layer as window of the silicon photodiode, a simple model can be used to analyze the process. Based on parameters measured by experiment, the quantum efficiency of the silicon photodiode is calculated, and the flux of incident synchrotron radiation is also obtained. |
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