Lithium intercalation in thin amorphous-silicon films |
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Authors: | T L Kulova A M Skundin Yu V Pleskov E I Terukov O I Kon’kov |
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Institution: | (1) Frumkin Institute of Electrochemistry, Russian Academy of Sciences, Leninskii pr. 31, Moscow, 119071, Russia;(2) Ioffe Physicotechnical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021, Russia |
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Abstract: | Electrochemical intercalation of lithium in thin films of amorphous hydrogenated silicon (a-Si:H), deposited at temperatures of 100 and 250°C on stainless-steel substrates, is studied. It is shown that the discharge capacity of films of identical thicknesses manufactured at a temperature of 250°C is greater than that for films produced at of 100°C. Dependence of the discharge capacity of the films manufactured at 250°C on their thickness is examined. It is established that an increase in the film thickness leads to acceleration of the decrease in the discharge capacity in the course of cycling. At a current density of 0.175 mA cm?2, the discharge capacity of films 0.25 and 1.35 μm thick equals nearly 2 Ah g?1 in a third cycle, whereas in a hundredth cycle it amounts to 1.10 and 0.37 Ah g?1, respectively. The diffusion coefficient for lithium in the films is equal to ~10-13 cm2s?1. |
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Keywords: | amorphous silicon thin films diffusion coefficient lithium intercalation |
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