Mixed valence on dilute Eu in YCu2Si2 |
| |
| Authors: | B. Bittins K. Keulerz A. Scherzberg J. P. Sanchez W. Boksch H. F. Braun J. Rohler H. Schneider P. Weidner D. Wohlleben |
| |
| Affiliation: | (1) II. Physikalisches Institut, Universität Köln, Zülpicher Strasse 77, D-5000 Köln 41, Federal Republic of Germany;(2) Institut für Festkörperforschung, Kernforschungsanlage Jülich GmbH, Postfach 1913, D-5170 Jülich 1, Federal Republic of Germany;(3) Centre de Recherches Nucléaires, Université Louis Pasteur, F-67307 Strasbourg Cedex, France;(4) DPMC Section Physique, Université de Genève, CH-1211 Genève 4, Switzerland |
| |
| Abstract: | We report measurements of electrical resistivity, thermopower, thermal conductivity, magnetic susceptibility, Mößbauer andLIII x-ray absorption of intermediate valent Eu in Y1–xEuxCu2Si2 alloys withx=0.03,x=0.07 andx=0.10. A qualitative comparison of the physical properties of dilute Eu in YCu2Si2 with concentrated Eu in EuCu2Si2 shows only slight differences; the dominant feature is a very strong variation of the Eu valence with temperature, from about 2.8 at 4 K to about 2.45 at 800 K, in the concentrated compound as well as in the dilute alloys. |
| |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ |
|
