New Closed-Form Formula for Series Inductance and Shunt Capacitance Based on Measured TDR Impedance Profile |
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Authors: | Xiangyin Zeng Jiangqi He Mingchang Wang Abdulla M. |
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Affiliation: | Intel Technol. Dev. Ltd., Shanghai; |
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Abstract: | Time domain reflectometry has been widely used to characterize high speed interconnects. The equivalent lumped LC model is then developed based on the measured impedance profile (Z-profile). However, for discrete L or C, mounted in the middle of transmission line interconnects, the current formula based on Z-profile cannot provide correct results. In this letter, a new closed-form formula based on the Z-profile is derived to determine the lumped L or C with the rise time of the incident step taken into account, which is easy to integrate into any EDA tools. |
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