Abstract: | Layers of Ni(DMG)2 and Ni(HAO)2 0.5-1 m thick were obtained by vacuum deposition. It was established by X-ray diffraction analysis (DRON-3M, DRON-SEIFERT-RM4, R = 192 mm, CuK
radiation) that the layers are oriented polycrystalline films irrespective of the type of support used. Structural organization of the films and molecular orientations relative to the support surface were analyzed based on crystal data. |