Fast heating in µ-thermal analysis</o:p> |
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Authors: | Mimi Y Keating |
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Institution: | (1) DuPont Central Research and Development, Experimental Station, Wilmington, DE 19880-0323, USA |
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Abstract: | Summary Thermal analysis of the 10 μm surface of materials using TA Instruments' μ-TA thermal probe and pulsed force mode AFM has
shown promising results. This addresses the need of additional surface characterization based on principle of Thermal Analysis,
which is complementary to other surface characterization techniques, i.e., Surface-IR, TOF-SIMS, etc. The method calls for
identification of surface landscape by imaging first, followed by fast heating the spots of interest. The micro thermal probe
is viewed to heat a small material with a tiny heater rather than to heat small material with a large heater in conventional
thermal analysis. In this paper, we demonstrate the applicability in the adhesion temperature of the topical coatings of Tyvek?
HDPE sheets, fusion of the heat-processed polyethylene fibers in a bundle, the surface crystallinity of PET pellets, and two
examples of phase images of toughened Nylon 66. Comparisons were made where it is possible with standard thermal analysis
techniques as well as with the microscopic techniques of AFM, TEM and optical. |
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Keywords: | TEM polyethylene AFM optical microscopy micro-thermal analysis Nylon 66 blends pulsed force mode AFM Tyvek? |
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