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Polarization Fizeau interferometer based on birefringent thin film
Authors:Linglin Zhu  Aijun Zeng  Fanyue Li  and Huijie Huang
Institution:1Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai 201800,China 2Graduate University of Chinese Academy of Sciences,Beijing 100049,China
Abstract:A polarization Fizeau interferometer based on birefringent thin film is presented.The interferometer adopts a birefringent thin film to obtain orthogonally polarized and strictly common-path reference and test beams.Advantages include ease of implementation on large-aperture interferometer,measuring test optics from long distance,and achieving high fringe visibility.The phase shift is obtained by combining a quarterwave plate and an analyzer.The concepts illustrated are verified experimentally.
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