Off-diagonal response by means of inelastic x-ray scattering |
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| Authors: | W. Schülke |
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| Affiliation: | Institut für Physik, Universität Dortmund, D46 Dortmund 50, West Germany |
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| Abstract: | Off-diagonal elements ?-1 (q, q + gh, ω) of the inverse dielectric matrix are shown to be measurable by means of inelastic scattering of X-ray photons from two different modes of the wave field, which is generated within the analyzer of a Laue-case X-ray interferometer at the interference position. |
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