Optical behaviour of melting for a thin metal film |
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Authors: | P. Cheyssac R. Kofman R. Garrigos |
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Affiliation: | Universite´de Toulon, 83130 la Garde, France;Laboratoire d''E´lectrooptique, Laboratoire 190 associe´au CNRS, Universite´de Nice, Parc Valrose, 06034 Nice Cedex, France |
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Abstract: | Reflectance measurements have been performed for gallium films at normal incidence (from 0.3 to 0.9 μm) in terms of temperature (from -20°C to + 40°C). The basic results are: (i) a drastic change in reflectance when melting occurs (about 20% at 0.6 μm), and (ii) a shift in the temperature of the solid-liquid transition with the thickness of the film which only takes place on and after the second melting (about 7°C for a film 250A?thick). |
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