X-ray diffraction and photoelectron spectroscopy study of swift heavy ion irradiated Mn/p-Si structure |
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Authors: | MK Srivastava DM Phase |
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Institution: | a Department of Physics, Banaras Hindu University, Varanasi 221005, India b UGC-DAE CSR, Indore 452017, India |
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Abstract: | The electronic structure and interfacial chemistry of thin manganese films on p-Si (1 0 0) have been studied by photoelectron spectroscopy measurements using synchrotron radiation of 134 eV and from X-ray diffraction data. The Mn/p-Si structures have been irradiated from swift heavy ions (∼100 MeV) of Fe7+ with a fluence of 1 × 1014 ions/cm2. Evolution of valence band spectrum with a sharp Fermi edge has been obtained. The observed Mn 3d peak has been related to the bonding of Mn 3d-Si 3sp states. Mn 3p (46.4 eV), Mn 3s (81.4 eV) and Si 2p (99.5 eV) core levels have also been observed which show a binding energy shift towards lower side as compared to their corresponding elemental values. From the photoelectron spectroscopic and X-ray diffraction results, Mn5Si3 metallic phase of manganese silicide has been found. The silicide phase has been found to grow on the irradiation. |
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Keywords: | 64 75 Ef 79 60 &minus i 74 25 Jb |
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