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XRD and XPS analysis of laser treated vanadium oxide thin films |
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| Authors: | S Beke L K?rösi A Oszkó |
| Institution: | a CRMC-N, UPR 7251 CNRS, Université de la Méditerranée, Case 901, 13288 Marseille Cedex 9, France b University of Szeged, Department of Otolaryngology, Faculty of Medicine, Tisza Lajos krt. 111, H-6725 Szeged, Hungary c University of Szeged, Supramolecular and Nanostructured Materials Research Group of the Hungarian Academy of Sciences, H-6720 Szeged, Hungary d Department of Solid State and Radiochemistry, University of Szeged, Aradi Vt1, H-6720 Szeged, Hungary e University of Szeged, Department of Physics, JGYTFK, H-6720 Szeged, Hungary |
| Abstract: | In this work, we present X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) analysis of laser treated vanadium oxide sols. The films were also observed by transmission electron microscopy (TEM) and scanning electron microscopy (SEM) to reveal how the original xerogel structure changes into irregular shaped, layer structured V2O5 due to the laser radiation. XRD revealed that above 102 W/cm2 the original xerogel structure disappears and above 129 W/cm2 the films become totally polycrystalline with an orthorhombic structure. XPS spectra showed O/V ratio increment by using higher laser intensities. |
| Keywords: | 68 55 Jk 81 20 Fw 61 80 Ba 79 60 i |
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