Chemical and structural characterisation of DGEBA-based epoxies by time of flight secondary ion mass spectrometry (ToF-SIMS) as a preliminary to polymer interphase characterisation |
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Authors: | Sven Passlack Alexander Brodyanski Wolfgang Bock Michael Kopnarski Melanie Presser Paul Ludwig Geiß Gunnar Possart Paul Steinmann |
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Institution: | 1.Institute for Surface and Thin Film Analysis (IFOS) and research center OPTIMAS,Kaiserslautern,Germany;2.Workgroup for Materials and Surface Technologies,University of Kaiserslautern,Kaiserslautern,Germany;3.Chair of Applied Mechanics,University of Erlangen-Nuremberg,Erlangen,Germany |
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Abstract: | Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has become a powerful tool in the field of surface analysis since
it provides information about the top few monolayers of a sample, i.e. on the chemical composition of the sample surface.
Thus, the general question arises whether a surface-sensitive technique like ToF-SIMS would be appropriate to detect systematic
chemical and/or structural changes in organic bulk polymers caused by varying a chemical content of the initial components
or by tracking, e.g. curing processes in such materials. It is shown that careful sample preparation and the use of multivariate
methods permit the quantitative acquisition of chemical and structural information about bulk polymers from the secondary
ion signals. The hardener concentration and a cross-linking coefficient in diglycidyl ether of bisphenol A based epoxies were
determined by ToF-SIMS measurements on samples with different resin to hardener ratio and varying curing time. In future work,
we will use the developed method to investigate the local composition of adhesively bonded joints. In particular, the mapping
of the chemical and structural properties in the so-called interphase will then be of interest. |
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Keywords: | Surface analysis Mass spectrometry SIMS Polymer Interphase |
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