开放性实验减少集成电路损坏的方法及问题探讨

在实验教学特别是开放性实验中，面对学生自主的理论验证、课题设计性实验的多种形式．由于学生对集成电路性能特点了解不够、使用不当而造成集成电路的损坏增多．本文通过分析和实践，归纳出集成电路性能的使用要点．掌握要点及使用方法，可有效减少或避免集成电路在实验中不必要的损失．

Approaches to Decreasing Damage to IC Devices in Open Laboratories

In experiment teaching, especially in an open laboratory, it is liable to give rise to damage to IC devices because of varieties of experiments to verify a theory, of those of the free planning experiments, of lack of full understanding of the properties and correct use of the IC devices. Based on analysis and practice, this paper expounds on some effective approaches and concludes that a good command of the approaches will decrease or avoid unnecessary damage to them.