The Local-Sampling Phase Shifting Technique for Precise Two-Dimensional Birefringence Measurement |
| |
| Authors: | Yukitoshi OTANI Takuya SHIMADA Torn YoSHIZAWA |
| |
| Institution: | (1) Deptartment of Mechanical Systems Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, 2-24-16, Naka-cho, Koganei, Tokyo 184, Japan |
| |
| Abstract: | A precise method for measurement of two-dimensional birefringence distribution is described and discussed. This method can determine the relative retardation and the azimuthal angle of the fast axis in an optical component. In order to detect relative retardation with high resolution, a local-sampling phase shifting technique is proposed. This method can measure 256 × 256 values of the birefringent phase difference and azimuthal angle in a short time with ± 0.02 deg (0.03 nm) of retardation accuracy. |
| |
| Keywords: | birefringence measurement quantization error local-sampling phase shifting technique |
| 本文献已被 SpringerLink 等数据库收录！ |
