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Fundamental properties of CdFe2O4 semiconductor thin film
Authors:Fengxiu Miao  Zanhong Deng  Xianshun Lv  Guixin Gu  Songming Wan  Xiaodong Fang  Qingli Zhang  Shaotang Yin
Institution:1. College of Materials and Chemistry & Chemical Engineering, Chengdu University of Technology, Chengdu 610059, China;2. Mineral Resources Chemistry Key Laboratory of Sichuan Higher Education Institutions, Chengdu 610059, China;1. Sino French Institute of Nuclear Engineering and Technology, Sun Yat-sen University, Zhuhai 519082, China;2. State Key Laboratory of Optoelectronic Materials and Technologies/Institute of Optoelectronic and Functional Composite Materials, School of Physics and Engineering, Sun Yat-sen University, Guangzhou 510275, China;1. Chemistry Department, Capital Normal University, Beijing, PR China;2. State Key Laboratory of Structure Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou, PR China;1. Low Carbon Energy Institute, China University of Mining & Technology, Xuzhou 221008, China;2. School of Materials Science and Engineering, China University of Mining & Technology, Xuzhou 221116, China
Abstract:
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