Mechanics of soft interfaces studied with displacement-controlled scanning force microscopy |
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Authors: | M.P. Goertz N.W. Moore |
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Affiliation: | 1. Sandia National Labs, Albuquerque, NM 87185, United States;2. Center for Integrated Nanotechnologies, Albuquerque, NM 87185, United States |
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Abstract: | The development of scanning force microscopes that maintain precise control of the tip position using displacement control (DC-SFM) has allowed significant progress in understanding the relationships between the chemical and mechanical properties of soft interfaces. Here, developments in DC-SFM techniques and their applications are reviewed. Examples of material systems that have been investigated are discussed and compared to measurements with other techniques involving nanoprobe geometries to illustrate the achievements and promise in this area. Specifically discussed are applications to soft interfaces, including SAMs, lipid bilayers, confined fluids, polymer surfaces, ligand–receptor bonds, and soft metallic films. |
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