Electrical breakdown in solid dielectrics

The mechanism of electrical breakdown in solid dielectrics is analyzed using the results of our investigations performed in this direction over a period of several decades. It is shown that the electrical breakdown in solid dielectrics involves interrelated prebreakdown processes, such as high-voltage polarization, defect formation, electron impact excitation and electron impact ionization of luminescence centers and ions in the host crystal lattice, etc. The electrical breakdown is initiated by electric-field and thermal generation of defects in the crystal. In turn, the generation of defects leads to the formation of defect regions and channels that provide an assisted transfer of charge carriers. Electron currents flow (and electrons are accelerated by the electric field to energies sufficient to induce impact ionization) in these regions of the crystal with a lattice distorted by defects. In this respect, the known approaches to the elaboration of the breakdown theory for alkali halide and other dielectric crystals on the basis of analyzing the motion and acceleration of electrons in an ideal crystal structure have appeared to be incorrect.