Depth magnetization profile of a perpendicular exchange coupled system by soft-x-ray resonant magnetic reflectivity |
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| Authors: | Tonnerre J M De Santis M Grenier S Tolentino H C N Langlais V Bontempi E García-Fernández M Staub U |
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| Institution: | Institut Néel, CNRS & Université Joseph Fourier, Grenoble Cedex 9, France. |
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| Abstract: | The magnetic profile across the interface of a perpendicular exchange coupled NiO/CoO]3/Pt-Co/Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign. |
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