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X-ray diffuse scattering measurements of nucleation dynamics at femtosecond resolution |
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| Authors: | Lindenberg A M Engemann S Gaffney K J Sokolowski-Tinten K Larsson J Hillyard P B Reis D A Fritz D M Arthur J Akre R A George M J Deb A Bucksbaum P H Hajdu J Meyer D A Nicoul M Blome C Tschentscher Th Cavalieri A L Falcone R W Lee S H Pahl R Rudati J Fuoss P H Nelson A J Krejcik P Siddons D P Lorazo P Hastings J B |
| Affiliation: | PULSE Center, Stanford Linear Accelerator Center, Menlo Park, California 94025, USA. |
| Abstract: | Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process. |
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