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Diagnostics of semiconductor structures by means of an apertureless near-field terahertz microscope |
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| Authors: | V. N. Trukhin A. O. Golubo A. V. Lyutetsky B. A. Matveyev N. A. Pikhtin L. L. Samoilov I. D. Sapozhnikov I. S. Tarasov M. L. Fel’shtyn D. P. Khor’kov |
| Affiliation: | 1. A. F. Ioffe Physical and Technical Institute of the Russian Academy of Sciences, St. Petersburg,, Russia 3. St. Petersburg State University of Information Technologies, Mechanics, and Optics, St. Petersburg, Russia 2. Institute for Analytical Instrumentation of the Russian Academy of Sciences, St. Petersburg, Russia |
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