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Magnetization reversal studies of continuous and patterned exchange biased NiFe/FeMn thin films
Authors:J Mohanty  S Vandezande  S Brems  M J Van Bael  T Charlton  S Langridge  R M Dalgliesh  K Temst  C Van Haesendonck
Institution:1. Laboratory of Solid-State Physics and Magnetism, KU Leuven, Celestijnenlaan 200D, 3001, Leuven, Belgium
4. Institute for Optics and Atomic Physics, Technical University Berlin, Hardenbergstr. 36, 10623, Berlin, Germany
3. ISIS, Rutherford Appleton Laboratory, Chilton, Oxon, OX11 0QX, UK
2. Instituut voor Kern-en Stralingsfysica, KU Leuven, Celestijnenlaan 200D, 3001, Leuven, Belgium
Abstract:In this article we present a detailed investigation of the structural and magnetic properties of exchange biased NiFe (ferromagnet)/FeMn (antiferromagnet) thin films. The influence of the shape anisotropy on exchange bias and the magnetization reversal mechanism in a sample with patterned lines is compared with a continuous two-dimensional reference sample. Polarized neutron reflectivity (PNR) is employed to study the magnetization reversal by analyzing the spin-flip and non-spin-flip reflectivities. PNR measurements show that the magnetization reversal in the reference two-dimensional film and patterned lines is by domain wall motion rather than coherent rotation of magnetization.
Keywords:
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