|
|||||
|
|
Cover Picture: Photon Counting Histogram Analysis for Two‐Dimensional Systems (ChemPhysChem 13/2011) |
|
| Authors: | Dr. Max Anikovsky Zach D. Wiltshire Dr. Klaus Weisshart Dr. Nils O. Petersen |
| Affiliation: | 1. National Institute for Nanotechnology, National Research Council and the University of Alberta, 11421 Saskatchewan Drive, Edmonton, Alberta T6G 2?M9 (Canada), Fax: (+1)?780‐641‐1601;2. Carl Zeiss MicroImaging GmbH, Carl Zeiss Group, Carl‐Zeiss‐Promenade 10, 07745 Jena (Germany) |
| Abstract: | |
| Keywords: | confocal microscopy fluorescence spectroscopy photon counting histogram surface analysis two‐dimensional systems |