Chromium tracer diffusion in NiO crystals |
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Authors: | W.K. Chen N.L. Peterson L.C. Robinson |
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Affiliation: | Materials Science Division, Argonne National Laboratory, Argonne, Ill. 60439, U.S.A. |
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Abstract: | Diffusion of 51Cr in NiO single crystals in air has been studied by the tracer-sectioning technique. In the temperature range 1192–1642°C, the diffusion coefficient can be expressed by the Arrhenius expression D=Doexp(-Q/RT), with Do=(8·6±1·2)×10?3 cm2/sec and Q=67·4±1·1 kcal/mole. The use of a high specific-activity tracer and a special configuration for the diffusion anneal prevented the self-dopling effect found by Seltzer and the evaporation of chromium from the sample surface. The present results, in conjunction with published results on nickel self-diffusion in NiO and interdiffusion in the NiO?Cr2O3 system, are used to determine a chromium ion-vacancy binding energy of about 5 kcal/mole in pure NiO. |
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