X-Ray Mapping and Interpretation of Scatter Diagrams |
| |
Authors: | Ken Moran Richard Wuhrer |
| |
Institution: | (1) Moran Scientific Pty Ltd, 4850 Oallen Ford Road, NSW 2580 Bungonia, Australia;(2) Microstructural Analysis Unit, University of Technology, P.O. Box 123, 2007 Broadway, Sydney, NSW, Australia |
| |
Abstract: | Electron beam induced quantitative X-ray mapping has become a very useful characterisation tool for determining the elemental
distribution in materials, whether using energy dispersive spectroscopy or wavelength dispersive spectroscopy. The X-ray intensity
distributions of the elements from an X-ray map allow us to generate two dimensional and ternary scatter diagrams thus converting
spatial information into concentration dimensions, which is an important tool for displaying the spatial relationships of
elements or correlated elements (phases) in materials. To best understand how to use this tool, we need to understand the
production and features of the scatter diagram. The type of clustering observed in the scatter diagram, whether oval, linear
or spherical, can give the major and trace element distributions within phases as well as qualitative and quantitative phase
information. This paper demonstrates the generation of scatter diagrams, properties of scatter diagrams, interpretation of
scatter diagrams and the advantages of scatter diagrams through the use of examples. |
| |
Keywords: | : Correlation diagram scatter diagrams X-ray mapping intensity histograms EPMA |
本文献已被 SpringerLink 等数据库收录! |
|