Use of low-background instrumental neutron activation analysis to measure contaminants in silicon and biological samples

Instrumental Neutron Activation Analysis (INAA) is a common method of trace element analysis whose sensitivity is limited either by interference from other trace elements in the sample or by interference from ambient background radiation in the detection system. In at least two cases, a true low-background facility, such as that at Lawrence Berkeley National Laboratory, substantially enhances senitivity: (1) Ultra-pure silicon, such as that used in semiconductor fabrication. Even after prolonged exposure within a nuclear reactor, minimal observable gamma-ray emitting activities are produced in the silicon. Extrapolated from our 7 gram sample size experiments, parts-per-quadrillion (1.E-15) sensitivity to 23 elements should be obtainable for 400 gram sample sizes. (2) Similarly, the life elements H, C, N, O are effectively inert within the reactor, and this enhances sensitivity to trace elements in, for example, bacteria. Data will be presented for these two cases.