| 多任务并发测试技术在提高测试效率降低测试成本中的应用 |
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| 引用本文： | 刘惠鹏,尹诗龙,闫肃.多任务并发测试技术在提高测试效率降低测试成本中的应用[J].中国集成电路,2013,22(9):63-67,80. |
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| 作者姓名： | 刘惠鹏 尹诗龙 闫肃 |
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| 作者单位： | 北京华峰测控技术有限公司AccoTEST事业部 |
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| 摘 要： | 本文介绍了多任务并发测试技术的基本原理。采用此技术后,可大大提升测试效率,降低测试成本。
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| 关 键 词： | 单任务 多任务 并发测试技术 转盘式分选机 PMIC |
Multi-task Concurrent Testing Technology to Improve Test Efficiency and Reduce Cost of Test |
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| LIU Hui-peng
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YIN Shi-long
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YAN Su.Multi-task Concurrent Testing Technology to Improve Test Efficiency and Reduce Cost of Test[J].China Integrated Circuit,2013,22(9):63-67,80. |
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| Authors: | LIU Hui-peng YIN Shi-long YAN Su |
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| Institution: | (AccoTEST BU of Beijing Huafeng Test ＆ Control Technology Co., Ltd |
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| Abstract: | This paper introduces the basic principle of multi-task concurrent testing technology. The application of this technology can greatly improve the efficiency of the testing, and reduce the costs. |
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| Keywords: | Single-task Multi-task Concurrent testing Rotary-handler PMIC |
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