Polariton reflectance spectra from thin ZnSxSe1−x layers

A study of reflectance spectra from thin ZnS_xSe_1−x solid-solution layers in the region of excitonic resonances is reported. It has been found that an increase in sulfur concentration in the layers increases the inhomogeneous broadening of the quantized polariton lines. It has been established that the inhomogeneous line broadening in a reflectance spectrum depends on the magnitude of exciton-photon mixing; it is small in the long-wavelength region where the photon component of the polariton is large, and large at short wavelengths where the mechanical component dominates. Fiz. Tverd. Tela (St. Petersburg) 40, 867–868 (May 1998)