| 掠入射凹面光栅谱仪高级次衍射光谱相对效率测量 |
| |
| 引用本文： | 濮宏图,吴健.掠入射凹面光栅谱仪高级次衍射光谱相对效率测量[J].强激光与粒子束,1997,9(4):0-626. |
| |
| 作者姓名： | 濮宏图 吴健 |
| |
| 作者单位： | 1.中物院核物理与化学研究所,成都525信箱84分箱 61 0003 |
| |
| 摘 要： | 测量了波长2.847、3.373、4.027、9.873和10.24nm谱线的一级和高级次光谱强度。给出了以一级光谱强度为标准的高级次衍射光谱的相对效率,并对测量结果进行了分析、讨论。
|
| 关 键 词： | 凹面光栅 光谱测量 相对效率 |
| 收稿时间： | 1900-01-01; |
ANALYSIS OF WAVELENGTH ERRORS IN ELLIPTICAL SPECTROMETER |
| |
| Pu Hongtu,Wu Jian,and Liu Shenggang Institute of Applied Physics,Univercity of Electronic Science and Technolegy of China, Liu Zhongli Southwest Institute of Nuclear Physics and Chemistry,P.O.Box ,Chengdu.ANALYSIS OF WAVELENGTH ERRORS IN ELLIPTICAL SPECTROMETER[J].High Power Laser and Particle Beams,1997,9(4):0-626. |
| |
| Authors: | Pu Hongtu Wu Jian and Liu Shenggang Institute of Applied Physics Univercity of Electronic Science and Technolegy of China Liu Zhongli Southwest Institute of Nuclear Physics and Chemistry POBox Chengdu |
| |
| Institution: | 1.Institute of Nuclear Physics and Chemistry ,CAEP ,P.O.B ox 525 84 ,Cheng du,610003 |
| |
| Abstract: | The errors of wavelength in elliptical crystal spectrometer are divided into two models:1) The target center is not on the focus of the ellipsoid, the target size can not be ignored, and the background scatters from any directons; 2) The X-ray is reflected from irregular crystal surface, which is not an ideal ellipsoid. The analysis of these two models are gvien and the relation between the wavelength errors and the aperture slit width are presented with digital calculation. The calculation data are agreeable to the experiments. |
| |
| Keywords: | crystal spectrometer error analysis |
| 本文献已被 CNKI 维普 等数据库收录！ |
| 点击此处可从《强激光与粒子束》浏览原始摘要信息 |
| 点击此处可从《强激光与粒子束》下载免费的PDF全文 |
