Microstructure of YBCO thin film and its effect on superheating |
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Authors: | YQ Cai X Yao |
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Institution: | (1) Department of Physics, Shanghai Jiao Tong University, 800 Dongchuan Road, Shanghai, 200240, P.R. China;(2) State Key Laboratory for Metal Matrix Composites, Shanghai Jiao Tong University, 1954 Huashan Road, Shanghai, 200030, P.R. China |
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Abstract: | Previously, we have reported a superheating phenomenon of a YBa2Cu3Ox (YBCO) film and studied its mechanism. In this work, we investigated the influence of microstructure on the superheating
of a YBCO thin film. Different melting behaviors were observed in situ from YBCO thin films with varied microstructures by
using high-temperature optical microscopy (HTOM). These films with different degrees of crystallinity were also characterized
by atomic force microscopy (AFM) and X-ray diffraction (XRD). It was found that the crystalline structure features of the
seed film have a great influence on the degree of superheating and the melting behavior. A high-quality film with a low fraction
of interface defects is believed to be responsible for the high superheating. On the basis of the experimental results from
HTOM, AFM, and XRD, the melting and superheating behaviors associated with the film defect structure are well interpreted
in terms of the semi-coherent interface-energy theory.
PACS 68.35.Md; 68.47.Gh; 68.55.Ac |
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Keywords: | |
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