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Nanometer-Scale Chemical Surface Analysis by Scanning (Tunnelling) Atom Probes |
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| Authors: | Paul F. A. Alkemade Nicolai N. Gribov |
| Affiliation: | (1) DIMES and Department of Applied Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands, NL |
| Abstract: | |
| Keywords: | : Scanning tunnelling microscopy atom probe chemical surface analysis ion mass spectrometry review. |
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