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Grazing incidence X-ray studies of ultra-thin Lumogen films |
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| Authors: | S.J. Keough T.L. Hanley J.S. Quinton |
| Affiliation: | a Smart Surface Structures Group, School of Chemistry, Physics and Earth Sciences, Flinders University, GPO Box 2100, Adelaide, SA 5001, Australia b Bragg Institute, Australian Nuclear Science and Technology Organisation, PMB 1, Menai, NSW 2234, Australia c School of Electrical and Information Engineering, University of South Australia, GPO Box 2471, Adelaide, SA 5001, Australia |
| Abstract: | Lumogen® Yellow S0790 films have been produced on silicon wafer substrates via physical vapour deposition (PVD) and spin-coating (SC) methods. These coatings were characterised with X-ray reflectometry (XRR) and grazing incidence X-ray diffraction (GIXD) techniques. The results show that ultra-thin (less than 12 nm) PVD films coat amorphously, with crystallinity becoming increasingly apparent with increasing film thickness. In contrast, measurements of ultra-thin (less than ∼2 nm) spin-coated films reveal a second, apparently stable crystalline structure. |
| Keywords: | Lumogen PVD UV imaging Thin films Grazing X-rays |
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